# Changes To Implement the Prioritized Examination for Requests for Continued Examination
> **US Patent and Trademark Office** · Final rule. · Published 2011-12-19 · Effective 2011-12-19 · 76 FR 78566
## Document
- **Document number:** 2011-32434
- **Category:** uspto-patent
- **Sub-agency:** US Patent and Trademark Office
- **Federal Register citation:** 76 FR 78566
- **CFR reference:** 37 CFR 1
- **Publication date:** 2011-12-19
- **Effective date:** 2011-12-19
- **Commerce docket:** Docket No. PTO-P-2011-0070
## Abstract

The Leahy-Smith America Invents Act includes provisions for prioritized examination of patent applications. The United States Patent and Trademark Office (Office) implemented the Leahy-Smith America Invents Act prioritized examination provision following the prioritized examination track (Track I) of the proposed 3-Track examination process in a previous final rule. The final rule was made applicable to newly filed patent applications. In order to provide patent applicants with the flexibility to accelerate processing of their applications in which a request for continued examination has been filed, the Office is now permitting applicants to request prioritized examination for applications after the filing of a request for continued examination.

## Source
- [Federal Register document](https://www.federalregister.gov/documents/2011/12/19/2011-32434/changes-to-implement-the-prioritized-examination-for-requests-for-continued-examination)
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