Nontechnical Description: The goal of this project is the development of a new type of microscope that can image materials with unprecedented spatial and temporal resolution. The new instrument is called an atomic resolution microwave microscope (ARMM) and is designed to have the capability of imaging fast moving electrons in electrical devices down to the atomic scale. Current state of the art microscopes can only visualize the atomic structure of devices when electrons are moving very slowly. This is inadequate for modern technology where there is need to not only visualize electrons at very small length scales (due to the relentless miniaturization of electrical devices), but also to visualize their behavior when they move very fast (due to the ever-increasing speed of modern technology). The new ARMM instrument is designed to image electrons when they move at speeds that allow them to orbit a device billions of times per second. These are called “microwave frequencies” and this frequency range is critical for many modern technological applications and quantum science discoveries. In order to develop more highly efficient electrical devices that can operate at these frequencies it is important to develop microscopes that can probe new materials in this regime. The ARMM instrument fulfills this need. Technical Description: The key capabilities of the new atomic-resolution microwave microscope (ARMM) include combined atomically resolved imaging and local microwave characterization of 2D devices. The new instrument is designed to operate at cryogenic temperatures in ultrahigh vacuum while integrating scanning tunneling microscopy, atomic force microscopy, microwave impedance microscopy (MIM), and electron spin resonance detection (STM ESR), all using the same probe tip. MIM and STM ESR will allow measurement of local high-frequency complex permittivity and spin resonance behavior. Major research projects involve the determination of how 2D Wigner crystals m