# CAREER: Characterization of Material Defects Using Broadband Two-Level-System Spectroscopy

> **NSF 01002627DB NSF RESEARCH & RELATED ACTIVIT** · Dartmouth College (NH) · $780,000

## Abstract

Nontechnical Description

This CAREER project advances the understanding of atomic-scale defects that limit the performance of next-generation materials in quantum electronics. These defects, known as two-level systems, can absorb energy and create noise in materials at very low temperatures. The research uses Broadband Cryogenic Transient Dielectric Spectroscopy (BCTDS), a measurement technique developed by the PI. The BCTDS technique enables direct probes of defects in quantum materials such as two-level systems. By connecting defects to how the materials are made and processed, the project helps the research community identify which materials host harmful defects, their nature, and how to avoid them. The activity also produces open data sets, analysis tools, and teaching materials that make it easier for students, educators, and researchers at a wide range of institutions to explore real data from quantum materials. Outreach efforts include interactive online modules, a podcast that highlights the people and processes behind the research, and an illustrated children’s book that explains the hidden structure inside materials. These activities make advanced materials research more accessible to entering undergraduates and help prepare a new generation of students to work at the intersection of materials science and modern quantum engineering.

Technical Description

This project establishes Broadband Cryogenic Transient Dielectric Spectroscopy as a quantitative, modular platform for characterizing two-level systems and related point defects in materials that support semiconducting and superconducting technologies. Two-level system defects are dominant sources of microwave dielectric loss and noise in thin films, interfaces, and bulk substrates. Yet their atomistic structure and dependence on processing history remain poorly understood. Conventional probes based on resonators and quantum bits are narrow band, spatially localized, and typically infer defects on

## Key facts

- **NSF award ID:** 2540460
- **Awardee organization:** Dartmouth College (NH)
- **SAM.gov UEI:** EB8ASJBCFER9
- **PI:** Mattias V Fitzpatrick
- **Primary program:** 01002627DB NSF RESEARCH & RELATED ACTIVIT
- **All programs:** CAREER-Faculty Erly Career Dev, QUANTUM INFORMATION SCIENCE, EXP PROG TO STIM COMP RES
- **Estimated total:** $780,000
- **Funds obligated:** $530,000
- **Transaction type:** Continuing Grant
- **Period:** 08/01/2026 → 07/31/2031

## Primary source

NSF Award Search: https://www.nsf.gov/awardsearch/showAward?AWD_ID=2540460

## Citation

> US National Science Foundation, Award 2540460, CAREER: Characterization of Material Defects Using Broadband Two-Level-System Spectroscopy. Retrieved via AI Analytics 2026-05-20 from https://api.ai-analytics.org/grant/nsf/2540460. Licensed CC0.

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