Changes To Implement the Prioritized Examination for Requests for Continued Examination
uspto-patent · US Patent and Trademark Office · Published 2011-12-19 · Effective 2011-12-19 · 76 FR 78566
Document
Document number
2011-32434
Federal Register citation
76 FR 78566
CFR reference
37 CFR 1
Type
Rule
Action
Final rule.
Category
uspto-patent
Sub-agency
US Patent and Trademark Office
Publication date
2011-12-19
Effective date
2011-12-19
Commerce docket
Docket No. PTO-P-2011-0070
Abstract
The Leahy-Smith America Invents Act includes provisions for prioritized examination of patent applications. The United States Patent and Trademark Office (Office) implemented the Leahy-Smith America Invents Act prioritized examination provision following the prioritized examination track (Track I) of the proposed 3-Track examination process in a previous final rule. The final rule was made applicable to newly filed patent applications. In order to provide patent applicants with the flexibility to accelerate processing of their applications in which a request for continued examination has been filed, the Office is now permitting applicants to request prioritized examination for applications after the filing of a request for continued examination.